CTK015

CTK015 ScanEM® near-field probes for easy detection and measurement of electromagnetic emission. Due to their high spatial resolution, ScanEM probes can identify the exact source of electromagnetic emission down to a single component. Knowing the type of EM radiation is critical for solving emission problems. ScanEM probes can detect electric (E) and magnetic (H) fields. ScanEM probes fit in the palm of a hand and are easy to operate. Their small size allows scanning for EMI in very tight areas. Typical applications are PC board level EMC diagnostics, signal integrity, repair and service.

• Pinpoint exact sources of EMI, detect electric and magnetic fields separately
• Small size, self-contained, audio output, LED color bar
• Will not disturb circuit operation, level/squelch dial
• RF output to spectrum analyzer and oscilloscope, DC output to a multimeter
• Frequency response is 2MHz to 2GHz (E field), 1MHz to 1GHz (H field)
• Typical sensitivity is 10dBm/(V/m) (E Field), -20dBm/mA (H Field)
• Approximate dimension is 6.18 inch x 1.21inch x 0.76inch
• 5-LED color level bar, speaker audio indication

Contents

One E field probe, One H filed probe, Plastic storage case, Batteries, User’s Guide, 6’ cable.