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BQ24210DQCT - 

Battery Charger for 1 Cell of Li-Ion battery, 7V input, 800 mA charge, SON-10

BQ24210DQCT - Battery Charger for 1 Cell of Li-Ion battery, 7V input, 800 mA charge, SON-10

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Manufacturer Part No:
BQ24210DQCT
Newark Part No.:
56T0491
Availability:
No Longer Manufactured

Product Information

:
Li-Ion
:
7
:
4.2
:
800
:
SON
:
10
:
1
:
-40
:
85
:
Each
:
-
:
Yes
:
MSL 2 - 1 year
:
To Be Advised
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Product Overview

The BQ24210DQCT is a 800mA single-input single cell Li-ion solar Battery Charger targeted at space-limited portable applications. The battery is charged in three phases such as conditioning, constant current and constant voltage with an IC thermal protection and safety timer. The charge current value is programmable through an external resistor. The high input voltage range with input overvoltage protection supports low-cost unregulated adapters. The input voltage regulation loop with programmable input voltage regulation threshold make it suitable for charging from alternative power sources, such as solar panel or inductive charging pad. Furthermore, when no input source is present, the IC has a load mode to power peripherals by connecting the battery to the VBUS. Load mode has current limiting function to prevent overload.
  • Input voltage dynamic power management feature (VBUS_DPM)
  • Selectable battery tracking mode to maximize the charge rate from solar panel using DPM feature
  • Load mode to support loads connected at VBUS pin
  • 1% Battery voltage regulation accuracy
  • Thermal regulation protection for output current control
  • Low battery leakage current
  • BAT short-circuit protection
  • NTC input monitoring
  • Built-in safety timer with reset control
  • Status indication-charging/power present
  • Green product and no Sb/Br

Applications

Power Management, Consumer Electronics, Portable Devices

Warnings

This device has limited built-in ESD protection, leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

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