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  • Manufacturer:
  • Newark Part No.: 75T7119
  • Manufacturer Part No KIT33662LEFEVBE

Product Overview

The KIT33662LEFEVBE is an evaluation module for MC33662L, LIN2.1/SAEJ2602-2, LIN physical layer. This kit is populated with a production device, and gives to you the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for electro static discharge (ESD) and bulk current injection (BCI) tests.
  • Individually routed power supply inputs for VDD and VBAT
  • Status of product indicated by an LED
  • Slave or master configuration via a switch
  • Wake button
  • Mode selector via a switch
  • Test point for every pin


Communications & Networking


KIT33662LEFEVBE Evaluation Board, CD MC33662.
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Product Specifications, Documents & More

  • Application Sub Type: LIN System
  • Features: Status of Product Indicated by LED, Slave or Master Configuration via a Switch
  • Kit Application Type: Communication & Networking
  • Kit Contents: Evaluation Board MC33662LEF, Software
  • SVHC: No SVHC (15-Jun-2015)
  • Silicon Core Number: MC33662LEF
  • Silicon Manufacturer: NXP


Availability:  0

    More stock available week commencing 5/16/16

Non-Cancelable / Non Returnable

Price for: Each 1

Minimum order quantity: 1

Order multiple quantity: 1

Pricing is unavailable. Please contact customer services.



Pricing is unavailable. Please contact customer services.


Legislation and Environmental

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