NXP  KIT33662JEFEVBE  Evaluation Board, 33662J, LIN 2.1/SAEJ2602-2, LIN Physical Layer, Slave or Master Configuration

Technical Data Sheet (571.86KB) EN See all Technical Docs

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Product Overview

The KIT33662JEFEVBE is an evaluation module for 33662J, LIN2.1/SAEJ2602-2, LIN physical layer. This kit is populated with a production device, and provides the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for electro static discharge (ESD) and bulk current injection (BCI) tests.
  • Individually routed power supply inputs for VDD and VBAT
  • Status of product indicated by an LED
  • Slave or master configuration via a switch
  • Wake button
  • Mode selector via a switch
  • Test point for every pin


Product Information

Silicon Manufacturer:
Silicon Core Number:
Kit Application Type:
Communication & Networking
Application Sub Type:
LIN System
Kit Contents:
Evaluation Board MC33662JEF, Software
Product Range:
Status of Product Indicated by LED, Slave or Master Configuration via a Switch
No SVHC (17-Dec-2015)

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  • Communications & Networking


KIT33662JEFEVBE Evaluation Board, CD MC33662.

Legislation and Environmental

RoHS Compliant:
Authorized Distributor

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