Low

KIT33662JEFEVBE - 

Evaluation Board, 33662J, LIN 2.1/SAEJ2602-2, LIN Physical Layer, Slave or Master Configuration

The actual product may differ from image shown

Manufacturer:
NXP NXP
Manufacturer Part No:
KIT33662JEFEVBE
Newark Part No.:
75T7118
Technical Datasheet:
(EN)
See all Technical Docs

Product Overview

The KIT33662JEFEVBE is an evaluation module for 33662J, LIN2.1/SAEJ2602-2, LIN physical layer. This kit is populated with a production device, and provides the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for electro static discharge (ESD) and bulk current injection (BCI) tests.
  • Individually routed power supply inputs for VDD and VBAT
  • Status of product indicated by an LED
  • Slave or master configuration via a switch
  • Wake button
  • Mode selector via a switch
  • Test point for every pin

Applications

Communications & Networking

Contents

KIT33662JEFEVBE Evaluation Board, CD MC33662.

Product Information

:
Communication & Networking
:
LIN System
:
NXP
:
MC33662JEF
:
-
:
Evaluation Board MC33662JEF, Software
Find similar products Choose and modify the attributes above to find similar products.

Related Searches

US continental orders over $49 and under 50 pounds may qualify for free ground shipping. Click the link for the full Terms and Conditions of the offer.

0 In stock

More stock available week commencing 11/20/17

Not Normally Stocked

Non-Cancelable / Non Returnable

$91.64 $ 91.64
Price for:
Each
Multiple: 1 Minimum: 1
Quantity Price
1 + $91.64
No longer stocked:: No Longer Manufactured::
Back Order
Total Price:
Total Price: ( )
Total Price: --

Customer Reviews

Customer Q&A Exchange

Community

Like to see information about this product from other customers?

 Read discussions, blogs, documents from our community members.

Filters:

Post a question to one of our experts or start a discussion and get responses from supplier experts and fellow engineers in our community.