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NXP  KIT33662JEFEVBE  Evaluation Board, 33662J, LIN 2.1/SAEJ2602-2, LIN Physical Layer, Slave or Master Configuration

Manufacturer:
NXP NXP
Manufacturer Part No:
KIT33662JEFEVBE
Newark Part No.:
75T7118
Technical Datasheet:
See all Technical Docs
NXP KIT33662JEFEVBE
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Product Overview

The KIT33662JEFEVBE is an evaluation module for 33662J, LIN2.1/SAEJ2602-2, LIN physical layer. This kit is populated with a production device, and provides the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for electro static discharge (ESD) and bulk current injection (BCI) tests.
  • Individually routed power supply inputs for VDD and VBAT
  • Status of product indicated by an LED
  • Slave or master configuration via a switch
  • Wake button
  • Mode selector via a switch
  • Test point for every pin

 

Product Information

Silicon Manufacturer:
NXP
Silicon Core Number:
MC33662JEF
Kit Application Type:
Communication & Networking
Application Sub Type:
LIN System
Kit Contents:
Evaluation Board MC33662JEF, Software
Product Range:
-
Features:
Status of Product Indicated by LED, Slave or Master Configuration via a Switch
SVHC:
No SVHC (17-Dec-2015)

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Applications

  • Communications & Networking

Contents

KIT33662JEFEVBE Evaluation Board, CD MC33662.

Legislation and Environmental

RoHS Compliant:
Yes
Authorized Distributor

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