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P2757G-1C1S - 

Contact, Connector, Test, PCB, Spring Loaded Probe, 4.75 mm, Point, 7 A, 30.73 mm, 2 oz

P2757G-1C1S - Contact, Connector, Test, PCB, Spring Loaded Probe, 4.75 mm, Point, 7 A, 30.73 mm, 2 oz

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Manufacturer Part No:
P2757G-1C1S
Newark Part No.:
50F5615
Product Range
P2757 Series
Technical Datasheet:
(EN)
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Product Information

:
Spring Loaded Probe
:
4.75mm
:
Point
:
7A
:
30.73mm
:
2oz
:
5oz
:
P2757 Series
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Product Overview

The P2757G-1C1S is a Test Spring Probe with gold-plated plunger and socket. This test spring probe features 60° point contact tip. Biasing-ball construction maximizes wiping contact of plunger to inner diameter of probe body. Pylon replaceable spring-loaded POGO® contacts provide high performance in testing and interconnect applications utilizing spring probe technology. Gold-plated contact body provides superior surface conditioning for consistently low contact resistance over life (typically 1000000 cycles).
  • <10mΩ Electrical resistance

Applications

Test & Measurement

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More stock available week commencing 3/5/18
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