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ANALOG DEVICES  EVAL-CN0273-EB1Z  CN0273, FET INSTRUMENT AMP, EVALUATION BOARD

ANALOG DEVICES EVAL-CN0273-EB1Z

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Product Overview

The EVAL-CN0273-EB1Z is a circuit evaluation board for high speed FET input instrumentation amplifier with low input bias current and high AC common mode rejection (CMR). This circuit utilizes ADA4817-2 low noise, 1GHz FastFET dual opamp and ADA4830-1 high speed difference amplifier with input short to battery protection IC. This circuit is a is a high speed FET input, gain of 5 instrumentation amplifier with a wide bandwidth (35MHz) and excellent ac common mode rejection, CMR. The circuit is ideal for applications where a high input impedance, fast in amp is required, including RF, video, optical signal sensing and high speed instrumentation. The high CMR and bandwidth also makes it ideal as a wideband differential line receiver. Most discrete in amps require expensive matched resistor networks to achieve high CMR. However, this circuit uses an integrated difference amplifier with on chip matched resistors to improve performance, reduce cost and minimize PCB layout area.
  • FET input instrumentation amplifier
  • High bandwidth
  • Small PCB footprint
  • Offset voltage of 4mV maximum
  • Input bias current of 2pA typical
  • Input common mode voltage of −3.5V to +2.2V maximum
  • Input differential voltage of ±3.5V/G1 maximum, where G1 is the gain of the first stage
  • Output voltage swing of 0.01V to 4.75V typical with 150ohm load
  • Common mode rejection of 55dB at 10MHz typical
  • Harmonic distortion of −60dBc at 10MHz

Applications

Sensing & Instrumentation; Test & Measurement
ESD sensitive device, take proper precaution while handling the device.

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Product Information

Silicon Manufacturer:
Analog Devices
Silicon Core Number:
ADA4817-2, ADA4830-1
Kit Application Type:
Amplifier
Application Sub Type:
Instrumentation Amplifier
Kit Contents:
Evaluation Board ADA4817-2, ADA4830-1
Product Range:
-
Features:
-
SVHC:
No SVHC (15-Jun-2015)

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Applications

  • Sensing & Instrumentation;
  • Test & Measurement

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